MBE growth of layered group-3 monochalcogenide thin films with non-prismatic monolayer structure 米澤隆宏, 村上達也, 東嶺孝一, CHEN Tongmin, 新田寛和, 久瀬雷矢, FLEURENCE Antoine, 大島義文, 高村(山田)由起子
応用物理学会春季学術講演会講演予稿集(CD-ROM), 67th, -, 2020
鉄におけるC15同素体の生成と成長 松原隆弥, 荒井重勇, MARINICA Mihai-Cosmin, WILLAIME Francois, DUDAREV Sergei, 網野岳文, ALEXANDER Rebecca, MESLIN Estelle, OLSSON Paer, ZHANG Yongfeng, 大島義文, 山本悠太, 樋口公考, 田中信夫, 荒河一渡
日本鉄鋼協会中国四国支部・日本金属学会中国四国支部講演大会講演概要集, 62nd-59th, -, 2019
透過電子顕微鏡その場観察によるグラフェンナノリボン電気伝導計測 大久保諒, LIU Chunmeng, ZHANG Xiaobin, SCHMIDT Marek. E, MURUGANATHAN Manoharan, 水田博, 大島義文
日本表面真空学会学術講演会講演要旨集, 2018, 191-, 2018
サスペンデッドグラフェンナノリボンのデバイス構造の作製 水谷加奈子, ZHANG Xiaobin, SCHMIDT Marek E., MURUGANATHAN Manoharan, 水田博, 水田博, 大島義文
応用物理学会秋季学術講演会講演予稿集(CD-ROM), 78th, -, 2017
27pTN-12 The quantitative study on the lithium column intensity i annular bright field image of LiV2O4 crystal. Lee S., Oshima Y., Sawada H., Okunishi E., Kondo Y., Tanishiro Y., Takayanagi K.
Meeting abstracts of the Physical Society of Japan, 66, 1, 987-987, 2011
24aPS-37 A Dopant Cluster in Sb-doped Si crystal studied by HAADF-STEM Kim S., Oshima Y., Sawada H., Hashikawa N., Asayama K., Kondo Y., Takeguchi M., Nakayama K., Tanishiro Y., Takayanagi K.
Meeting abstracts of the Physical Society of Japan, 65, 2, 847-847, 2010
25pWZ-3 A Dopant Cluster in Sb-doped Si crystal studied by HAADF-STEM Kim S., Oshima Y., Sawada H., Hashikawa N., Asayama K., Kondo Y., Tanishiro Y., Takayanagi K.
Meeting abstracts of the Physical Society of Japan, 65, 2, 920-920, 2010
25pWZ-1 Observation of CuInSe_2 crystal defect by STEM Takeshita A., Tanaka T., Hibino K., Sawada H., Kondo Y., Kubota T., Miyake H., Oshima Y., Tanishiro Y., Takayanagi K.
Meeting abstracts of the Physical Society of Japan, 65, 2, 920-920, 2010
Detection of arsenic dopant atoms in a silicon crystal using a spherical aberration corrected scanning transmission electron microscope Y. Oshima, Y. Hashimoto, Y. Tanishiro, K. Takayanagi, H. Sawada, T. Kaneyama, Y. Kondo, N. Hashikawa, K. Asayama
PHYSICAL REVIEW B, 81, 3, 035317-, 2010
Detection of arsenic dopant atoms in a silicon crystal using a spherical aberration corrected scanning transmission electron microscope Y. Oshima, Y. Hashimoto, Y. Tanishiro, K. Takayanagi, H. Sawada, T. Kaneyama, Y. Kondo, N. Hashikawa, K. Asayama
PHYSICAL REVIEW B, 81, 3, 035317-, 2010
26aYK-13 Detection of Arsenic Atoms doped in Silicon Crystalline using Spherical Aberration Corrected Scanning Transmission Electron Microscope Oshima Y., Hashimoto Y., Hashikawa N., Asayama K., Kondo Y., Tanishiro Y., Takayanagi K.
Meeting abstracts of the Physical Society of Japan, 64, 2, 870-870, 2009
Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy T. Tomita, Y. Tanishiro, T. Miyata, H. Sawada, F. Hosokawa, T. Kaneyama, Y. Kondo, T. Tanaka, Y. Ohshima, N. Yamamoto, K. Takayanagi
MICROSCOPY AND MICROANALYSIS, 15, 1084-1085, 2009
Measurement method of aberration from Ronchigram by autocorrelation function H. Sawada, T. Sannomiya, F. Hosokawa, T. Nakamichi, T. Kaneyama, T. Tomita, Y. Kondo, T. Tanaka, Y. Oshima, Y. Tanishiro, K. Takayanagi
ULTRAMICROSCOPY, 108, 11, 1467-1475, 2008
Measurement method of aberration from Ronchigram by autocorrelation function H. Sawada, T. Sannomiya, F. Hosokawa, T. Nakamichi, T. Kaneyama, T. Tomita, Y. Kondo, T. Tanaka, Y. Oshima, Y. Tanishiro, K. Takayanagi
ULTRAMICROSCOPY, 108, 11, 1467-1475, 2008
Achieving 63pm resolution in scanning transmission electron microscope with spherical aberration corrector Hidetaka Sawada, Fumio Hosokawai, Toshikatsu Kaneyama, Toshihiro Ishizawa, Mitsuhisa Terao, Muneyuki Kawazoe, Takumi Sannomiya, Takeshi Tomita, Yukihito Kondo, Takayuki Tanaka, Yoshifumi Oshima, Yasumasa Tanishiro, Naoki Yamamoto, Kunio Takayanagi
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 46, 20-24, L568-L570, 2007
Achieving 63pm resolution in scanning transmission electron microscope with spherical aberration corrector Hidetaka Sawada, Fumio Hosokawai, Toshikatsu Kaneyama, Toshihiro Ishizawa, Mitsuhisa Terao, Muneyuki Kawazoe, Takumi Sannomiya, Takeshi Tomita, Yukihito Kondo, Takayuki Tanaka, Yoshifumi Oshima, Yasumasa Tanishiro, Naoki Yamamoto, Kunio Takayanagi
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 46, 20-24, L568-L570, 2007
ナノ現象の顕微研究
大島義文, 谷城康眞, 近藤行人, 高柳邦夫
応用物理, 75, 3, 309-313, 2006
Improved emitter-base junction with In2O3 in dielectric-base transistor T Hato, H Takauchi, A Yoshida, H Tamura, N Fujimaki, Y Oshima, N Yokoyama
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 34, 12A, 6379-6381, 1995
Improved emitter-base junction with In2O3 in dielectric-base transistor T Hato, H Takauchi, A Yoshida, H Tamura, N Fujimaki, Y Oshima, N Yokoyama
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 34, 12A, 6379-6381, 1995
微粒子の相転移 大島義文, 高柳邦夫
固体物理, 28, 12, 65-70, 1993
High-resolution electron microscopy of fine particles
yoshifumi oshima
Microsc.Microanal.Microstruct., 4, 297-304, 1993
微粒子の臨界現象 大島義文
数理科学, 352, 10, 56-59, 1992